Best Paper Competition

QSR_Best_Student_Paper_Contest_Rules(Updated Jan-2010)

QSR_Best_Student_Paper_Contest_Rules (Updataed Feb-2007)

Competition Announcement (02/2007)

• The finalists of the 2008 QSR Best Student Paper Competition are (in alphabetical order):
  DENG, et al. , Georgia Institute of Technology, Statistical approach to quantifying the elastic deformation of nanomaterials

  JEONG, et al. , Rutgers University, Spatial correlogram-based dynamic time warping for automatic detection of defect patterns in wafer maps

  SHRIVISTAVA and DING (winner) Texas A&M University, Graph based isomorph-free generation of two-level regular fractional factorial designs (WINNER)

  SUKCHOTRAT, et al. University of Texas, Classification-based control charts for monitoring multivariate processes

• The finalists of the 2007 QSR Best Student Paper Competition are( in alphabetic order):

  Alaa Elwany, Georgia Institute of Technology, Sensor-Based Models for Maintenance Management Decisions

  Ying Hung, Georgia Institute of Technology, Design and Analysis of Computer Experiments with Branching and Nested Factors

  Xuemei Shan, Northwestern University, Blind Identification of Manufacturing Variation Patterns by Combining Source Separation Criteria

  Haifeng (Heidi) Xia, Texas A&M University, Bayesian Hierarchical Model for Integrating Multi-resolution Metrology Data WINNER

• The finalists of the 2006 QSR Best Student Paper Competition are( in alphabetic order):

  Tirthankar Dasgupta, Georgia Institute of Robust Synthesis of Nanostructures Robust Synthesis of Nanostructures Robust Synthesis of Nanostructures Robust Synthesis of Nanostructures Robust Synthesis of Nanostructures Robust Synthesis of Nanostructures Robust Synthesis of Nanostructures

  Lingyan Ruan, Georgia Institute of Technology, Robust Parameter Design for Quality Variables and Reliability Measures Robust Parameter Design for Quality Variables and Reliability MeasuresRobust Parameter Design for Quality Variables and Reliability MeasuresRobust Parameter Design for Quality Variables and Reliability MeasuresRobust Parameter Design for Quality Variables and Reliability MeasuresRobust Parameter Design for Quality Variables and Reliability MeasuresRobust Parameter Design for Quality Variables and Reliability Measures

  Tao Yuan, The University of Tennessee, Defect Pattern Recognition in Semiconductor Fabrication using Model-based Clustering and Bayesian Inference

  Jing Zhong, The University of Michigan, Design of DOE-based Automatic Process Controller with Consideration of Model Uncertainties Design of DOE-based Automatic Process Controller with Consideration of Model Uncertainties Design of DOE-based Automatic Process Controller with Consideration of Model Uncertainties Design of DOE-based Automatic Process Controller with Consideration of Model Uncertainties Design of DOE-based Automatic Process Controller with Consideration of Model Uncertainties Design of DOE-based Automatic Process Controller with Consideration of Model Uncertainties Design of DOE-based Automatic Process Controller with Consideration of Model Uncertainties (WINNER)

• The finalists of the 2005 QSR Best Student Paper Competition are( in alphabetic order):
  Jung Jin Cho, Texas A&M, Redundancy Analysis of Linear Sensor Systems and Its Applications Redundancy Analysis of Linear Sensor Systems and Its Applications Redundancy Analysis of Linear Sensor Systems and Its Applications Redundancy Analysis of Linear Sensor Systems and Its Applications Redundancy Analysis of Linear Sensor Systems and Its Applications Redundancy Analysis of Linear Sensor Systems and Its Applications Redundancy Analysis of Linear Sensor Systems and Its Applications

  Xuelei (Sherry) Ni, Georgia Institute of Technology, Enhanced Leaps-And-Bounds Method in Subset Selections with Additional Optimality Tests

  Zhiguang Qian, Georgia Institute of Technology, Bayesian Surrogate Models for Integrating Low-accuracy and High-accuracy Experiments Bayesian Surrogate Models for Integrating Low-accuracy and High-accuracy Experiments Bayesian Surrogate Models for Integrating Low-accuracy and High-accuracy Experiments Bayesian Surrogate Models for Integrating Low-accuracy and High-accuracy Experiments Bayesian Surrogate Models for Integrating Low-accuracy and High-accuracy Experiments Bayesian Surrogate Models for Integrating Low-accuracy and High-accuracy Experiments Bayesian Surrogate Models for Integrating Low-accuracy and High-accuracy Experiments (WINNER)

  Sarintip Satitsatian, University of Washington, Seattle, An Algorithm for Reliability Bounds Computation to Evaluate Supply Chain Networks

• The finalists of the 2004 QSR Best Student Paper Competition are( in alphabetic order):

  Chang-Ho Chin, Texas A&M, Optimal Filter Design Approach to Statistical Process Control

  Shwu-Tzy Jiang, University of Oklahoma, Proportional intensity model robustness for right-censored failure data Proportional intensity model robustness for right-censored failure data Proportional intensity model robustness for right-censored failure data Proportional intensity model robustness for right-censored failure data Proportional intensity model robustness for right-censored failure data Proportional intensity model robustness for right-censored failure data Proportional intensity model robustness for right-censored failure data

  Z. Lian, The Pennsylvania State University, Setup Error Adjustment of Multiple Lots using a Sequential Monte Carlo Method

  Abhyuday Mandal, Georgia Tech, SELC : Sequential Elimination of Level Combinations by Means of Modified Genetic Algorithms SELC : Sequential Elimination of Level Combinations by Means of Modified Genetic Algorithms SELC : Sequential Elimination of Level Combinations by Means of Modified Genetic Algorithms SELC : Sequential Elimination of Level Combinations by Means of Modified Genetic Algorithms SELC : Sequential Elimination of Level Combinations by Means of Modified Genetic Algorithms SELC : Sequential Elimination of Level Combinations by Means of Modified Genetic Algorithms SELC : Sequential Elimination of Level Combinations by Means of Modified Genetic Algorithms (WINNER)

• The finalists and the winner of the 2003 QSR Best Student Paper Competition are:
  Hong Wan, Northwestern University, Controlled Sequential Bifurcation: A New Factor-Screening Method Controlled Sequential Bifurcation: A New Factor-Screening Method Controlled Sequential Bifurcation: A New Factor-Screening Method Controlled Sequential Bifurcation: A New Factor-Screening Method Controlled Sequential Bifurcation: A New Factor-Screening Method Controlled Sequential Bifurcation: A New Factor-Screening Method Controlled Sequential Bifurcation: A New Factor-Screening Method (WINNER)

  Myong K. Jeong, Georgia Tech, Wavelet-Based SPC Procedure for Complicated Functional Data

  Pansoo Kim, Texas A&M University, Optimal Engineering System Design Guided by Data-Mining Methods Optimal Engineering System Design Guided by Data-Mining Methods Optimal Engineering System Design Guided by Data-Mining Methods Optimal Engineering System Design Guided by Data-Mining Methods Optimal Engineering System Design Guided by Data-Mining Methods Optimal Engineering System Design Guided by Data-Mining Methods Optimal Engineering System Design Guided by Data-Mining Methods

  Haitao Liao, Rutgers University, Customer-Oriented Reliability Verification and Robust Design Optimization for Highly Reliable Products under Stochastic Use Conditions Customer-Oriented Reliability Verification and Robust Design Optimization for Highly Reliable Products under Stochastic Use Conditions Customer-Oriented Reliability Verification and Robust Design Optimization for Highly Reliable Products under Stochastic Use Conditions Customer-Oriented Reliability Verification and Robust Design Optimization for Highly Reliable Products under Stochastic Use Conditions Customer-Oriented Reliability Verification and Robust Design Optimization for Highly Reliable Products under Stochastic Use Conditions Customer-Oriented Reliability Verification and Robust Design Optimization for Highly Reliable Products under Stochastic Use Conditions Customer-Oriented Reliability Verification and Robust Design Optimization for Highly Reliable Products under Stochastic Use Conditions

• The finalists and the winner of the 2002 QSR Best Student Paper Competition are:

  Wenzhen Huang, University of Wisconsin-Madison, for the paper, Mode-Based Decomposition of Part Form Error by Discrete-Cosine-Transform with Implementation to Assembly and Stamping System with Compliant Parts Mode-Based Decomposition of Part Form Error by Discrete-Cosine-Transform with Implementation to Assembly and Stamping System with Compliant PartsMode-Based Decomposition of Part Form Error by Discrete-Cosine-Transform with Implementation to Assembly and Stamping System with Compliant PartsMode-Based Decomposition of Part Form Error by Discrete-Cosine-Transform with Implementation to Assembly and Stamping System with Compliant PartsMode-Based Decomposition of Part Form Error by Discrete-Cosine-Transform with Implementation to Assembly and Stamping System with Compliant PartsMode-Based Decomposition of Part Form Error by Discrete-Cosine-Transform with Implementation to Assembly and Stamping System with Compliant PartsMode-Based Decomposition of Part Form Error by Discrete-Cosine-Transform with Implementation to Assembly and Stamping System with Compliant Parts.(WINNER)

  Carla Vivacqua, University of Wisconsin-Madison, for the paper, Using Strip-Block Designs as an Alternative to Reduce Costs of Experimentation in Robust Product Design.

  Hyun-Woo Cho, Pohang University of Science and Technology, for the paper, Fault Diagnosis of Batch Processes: A New Statistical Approach Using Discriminant Model

  Jun Bai, Rutgers University, for the paper, Warranty Cost Models of Renewable Risk-Free Policy for Multi-Component Systems.

• The finalists and the winner of the 2001 QSR Best Student Paper Competition are:

  Yong Chen, University of Michigan-Ann Arbor, for the paper Quality and Reliability Chain Modeling for System Reliability Analysis of Multi-station Manufacturing Processes Quality and Reliability Chain Modeling for System Reliability Analysis of Multi-station Manufacturing ProcessesQuality and Reliability Chain Modeling for System Reliability Analysis of Multi-station Manufacturing ProcessesQuality and Reliability Chain Modeling for System Reliability Analysis of Multi-station Manufacturing ProcessesQuality and Reliability Chain Modeling for System Reliability Analysis of Multi-station Manufacturing ProcessesQuality and Reliability Chain Modeling for System Reliability Analysis of Multi-station Manufacturing ProcessesQuality and Reliability Chain Modeling for System Reliability Analysis of Multi-station Manufacturing Processes(WINNER)

  Rong Pan, Penn State University, for the paper Comparison of Some Process Adjustment Methods and their Integration with SPC Charts

  Charles Ribardo, Ohio State University, for the paper An Alternative Desirability Function for Achieving Six Sigma Quality

  Roshan Joseph Vengazhiyil, University of Michigan, for the paper Robust Parameter Design of Multiple Target Systems Robust Parameter Design of Multiple Target Systems Robust Parameter Design of Multiple Target Systems Robust Parameter Design of Multiple Target Systems Robust Parameter Design of Multiple Target Systems Robust Parameter Design of Multiple Target Systems Robust Parameter Design of Multiple Target Systems

  Wenbiao Zhao, Rutgers University, for the paper Modeling Accelerated Life Testing Based on Mean Residual Life Modeling Accelerated Life Testing Based on Mean Residual Life Modeling Accelerated Life Testing Based on Mean Residual Life Modeling Accelerated Life Testing Based on Mean Residual Life Modeling Accelerated Life Testing Based on Mean Residual Life Modeling Accelerated Life Testing Based on Mean Residual Life